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LSFM-100 four point measurement system

The LSFM-100 four point measuring system is to arrange the probes on the object to be measured in sequence and at equal intervals, apply appropriate pressure, and the probes form ohmic contact with the object to be measured. The resistance and square resistance of the object to be measured can be measured, and the resistivity of the object to be measured can be calculated when the thickness of the object to be measured is known. The independently developed control software matched with this syst

  • Main specifications: resistivity: 10-4 ~ 108 Ω· m; Resistance: 10-4 ~ 108 Ω; Resolution: 100 μ Ω;
  • Applicable sample size: the size can be as low as 4mm × 4mm (piece/time);
  • Applicable sample materials: conductive samples such as blocks and films;
  • Equipment measurement mode: basic mode (automatic selection of measuring current and measuring points), advanced mode (manual selection of measuring current and measuring points, scanning of measuring resistance, etc.).
  • Product features:

1. It can measure the carrier concentration and other important parameters of materials under different temperatures and magnetic fields;

2.3 minutes to get a Hall effect data;

3. The test accuracy reaches 0.5 ℃;

4. High measurement accuracy, measurement resolution up to 0.01;

  • Application field:

1. Resistance and resistivity measurement;

2. IV curve test;

3. Low power pulse IV curve measurement;

4. Differential conductance measurement;

5. Delta small resistance measurement;


  • Detailed parameters of the instrument:

Probe spacing

1±0.01mm

Sample size

4mm×4mm

Resistance

 

Resistivity

m

Resolving power

100μΩ

Probe

Basic model (4 probes)

Upgrade model (16 probes)

Product size

40cm*25cm*50cm


  • Product picture:

  • Picture:


  • Screenshot of product software:


LSFM-100 four point measurement system
The LSFM-100 four point measuring system is to arrange the probes on the object to be measured in sequence and at equal intervals, apply appropriate pressure, and the probes form ohmic contact with the object to be measured. The resistance and square resistance of the object to be measured can be measured, and the resistivity of the object to be measured can be calculated when the thickness of the object to be measured is known. The independently developed control software matched with this syst
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LSFM-100 four point measurement system

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INQUIRY

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TEL: +86 15565213902 

Email: lsgdjs@lsgdjs.cn

Location: No. 55 Yulan Street, High-tech Industrial Cluster, Zhengzhou City, China

Website: www.lspec.com.cn

© 2020 deome site . All rights reserved       Site Map

TEL: +86 15565213902 

Email: lsgdjs@lsgdjs.cn

Location: No. 55 Yulan Street, High-tech Industrial Cluster, Zhengzhou City, China

Website: www.lspec.com.cn

© 2020  All rights reserved Raytheon        Site Map

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